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Product Categories for probe contact
Electrical Contact and Electrode Materials -
(244 companies)
Electrical contact and electrode materials are soft, high conductivity, oxidation resistant materials used in circuit breakers, relays, and for EDM applications
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Electrical Contacts and Contact Materials -
(91 companies)
Electrical contacts and contact materials are soft, high-conductivity, oxidation- resistant materials that are used in circuit breakers, relays, switches, and electrical discharge machining (EDM) applications. They often have a second phase in order to provide anti-welding and/or arc resistance
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CMM Probes -
(59 companies)
Coordinating measuring machine (CMM) probes are transducers that convert physical measurements into electrical signals, using various measuring systems within the probe structure
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Test Probes, Electrical -
(188 companies)
Electric test probes are used to establish a connection between a circuit under test and the measuring instrument
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Temperature Probes -
(608 companies)
Temperature probes are used in various temperature sensing applications. Technology options include thermocouple, RTD, thermistor and solid state style probes
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Temperature Instruments, All Types -
(2045 companies)
Temperature instruments use contact or noncontact methods to measure temperature. Products include dial, digital, industrial and laboratory thermometers; temperature probes, indicators, and sensors; RTD elements and transmitters; and thermistors, thermocouples, thermopiles, and thermal switches. 
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Position Probes -
(137 companies)
Position probes measure the position of a target surface, usually with a high degree of accuracy. This search form covers many different linear position products
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Electrical Brushes and Brush Materials -
(32 companies)
Electrical brushes and brush materials are used in conjunction with slip rings, commutators or other contact surfaces to maintain an electrical connection in rotary and linear sliding contact applications
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Temperature Sensors -
(169 companies)
Temperature sensors are measurement devices that infer temperature by sensing some physical characteristic (i.e. resistance, emf or thermal radiation).
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Styli and Probes -
(52 companies)
Styli and probes are slender, rod-shaped stems and contact tips or points used to probe surfaces in conjunction with profilometers, SPMs, CMMs, gages and dimensional scanners
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IC Pin Probes -
(13 companies)
IC pin probes are used to test integrated circuits (ICs
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Wafer and Thin Film Instrumentation -
(261 companies)
Wafer and thin film instrumentation includes quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, and C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
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Semiconductor Metrology Instruments -
(113 companies)
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
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Linear Position Sensors, All Types -
(546 companies)
Linear position sensors, all types, is a general search form for all linear position / displacement detection product areas.
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IC Sockets and Interconnect Components -
(474 companies)
IC sockets and interconnect components interface or connect a microelectronic semiconductor chip to a board or larger scale device.
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Product Announcements for probe contact
Product Announcements: 1 - 10 of 6826
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Heidenhain Corporation
Workpiece Touch Probes Increase Productivity
The use of touch probes reduces setup times, helps to increase machine usage time, and improves the dimensional accuracy of the finished workpieces. Their setup, measuring and monitoring functions can be performed manually or automatically. Touch probes are used primarily on milling machines and machining centers, and ... -HEIDENHAIN Corporation
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Renishaw
RMP600 machine probe out-of-sight in 3D precision
Bringing "out of sight" precision to complex 3D part measurement on machine tools, the new RMP600 touch probe combines two exclusive Renishaw technologies — highest accuracy strain-gage sensing and frequency-hopping spread-spectrum (FHSS) radio transmission. The design allows unmatched precision where obstacles or part features block transmission by optical line-of-sight probes.
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Renishaw
2-in-1 versatility - Scanning probes for your CMMs
Dual-purpose probe performs scanning and touch trigger probing for ultimate flexibility, while compact design optimizes feature access and probe configurability
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Heidenhain Corporation
HEIDENHAIN's Battery-Free Infrared Touch Probe
For users looking for an alternative to battery-operated touch probes for machining applications, HEIDENHAIN Corporation offers the TS 444 infrared touch probe. The new TS 444 can be powered by an alternative energy source in the form of compressed air supplied through the spindle of the machine tool, and can be of use with all HEIDENHAIN control systems.
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Heidenhain Corporation
HEIDENHAIN 3D Touch Probes for 3rd Party Controls
Now more can enjoy the benefits of HEIDENHAIN's 3D touch trigger probes as they can now be used on many CNC controls for milling, drilling and boring machines, and machining centers. This is possible through the use of HEIDENHAIN's new UTI 192 Universal Touch Probe Interface making these probes compatible with CNC controls with a fast switching input.
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Heidenhain Corporation
HEIDENHAIN's Highly Accurate 3D Tool Touch Probe
With the introduction of the TS 740 infrared touch probe, HEIDENHAIN offers machine tool users the opportunity to perform measuring tasks that require an especially high probing accuracy and repeatability. Providing both of these things, the TS 740 workpiece touch probe has become one of the most accurate 3D touch probes for machine tools in the market today.
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QA Technology Company, Inc.
Spring Contact Probes
QA's patented rolled design probes attribute their increased accuracy and performance to our fully automatic assembly and test machines. Our machines are designed and built in-house, from the micro-processor controllers to the assembly mechanisms themselves.
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SPEA America
4040 Multimode Flying Probe Tester
SPEA 4040 Multimode is an accurate and fast flying probe test system, ideal to test prototypes and pre-series as well as production volume boards. It can perform multi-function test (in-circuit, functional, optical, boundary scan, on board programming, and more) with a very high throughput.
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Aeroflex Incorporated
4550 Series Flying Probes
Striving for ongoing product improvement, Aeroflex has added soft landing and partial accessibility software options to its 4550 Flying Probe Test System. The 4550 is a powerful and flexible Printed Circuit Board (PCB) test solution designed to meet the test needs of today and with the continued addition of new features and capabilities, it will meet tomorrow's test needs as well.
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Temptronic Corporation
Cold Probing Upgrade
Temptronic can upgrade your existing probing station to add -55°C Moisture-free probing capability with their exclusive "Cold Probing Upgrade".
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Part Numbers for probe contact
| Part # |
Distributor |
Manufacturer |
Product Category |
Description |
| 2810175-ND |
Digi-Key |
Phoenix Contact
|
Sensors, Transducers
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ISOLATED THERMOCOUPLE +/-10V |
Other Topics You Might Be Interested In
QA Technology's standard test probes are lubricated to increase their life. The lubricant drastically reduces the normal wear from the sliding metal-to-metal contact within the probe.
Sixteen pieces...
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X Probe Termination Pin set height is a critical factor in the performance and life of the X Probe. When set too low, the X Probe is under-stroked, reducing the contact force and the X Probe's ability...
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The Indicator Probe is a special use probe, which shows the amount that standard probes are deflected in a test fixture. The indicator probe’s plunger does not return to its original extended...
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High electrical resistance between the probe tip and the contact surface is the most common failure mode for probes. This is caused by one or more of the following:
Contamination buildup on the probe...
( Read More)
Test probes used in production testing will eventually get dirty enough to cause contact problems. The following steps will eliminate contact problems caused by dirty probes:
Test Environment - The...
( Read More)
Tools & Useful Links for probe contact
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Engineering Web: probe contact
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